Ph.D. course on application of x-ray diffraction in materials science

• explain the fundamentals of kinematical scattering theory
• extract microstructural information from x-ray diffraction
• interpret the position of diffraction peaks and the diffracted intensity
• apply appropriate measuring and evaluation routines for quantitative phase analysis, quantitative texture analysis, quantitative stress analysis and line profile analysis
• determine residual stresses from x-ray diffraction and classify them into stresses of first, second or third kind
• interpret pole figures and quantify crystallographic textures
• determine defect densities from x-ray line profiles
• describe the differences between laboratory x-ray equipment and synchrotron sources
• discuss and present results of an x-ray diffraction experiment

The course will provide lectures on the fundamentals of x-ray diffraction (kinematical scattering theory) and an introduction to common methods for microstructure analysis as quantification of crystallographic texture, evaluation of internal stresses and strains and line profile analysis. By self-study the Ph.D. student will further deepen the general knowledge about the different techniques with focus on a chosen special application. The Ph.D. students will present and discuss results of measurements with laboratory equipment or from synchrotron experiments based on literature or own data.

M.Sc. in Physics, Chemistry, Mathematics or Engineering

Introductory lectures, self-study, assignments and presentation