Test of Digital Systems

• Describe and explain basic methods and concepts in test and design for test of integrated circuits (e.g. stuck-at faults, D-algorithm, built-in self-test)
• Describe what a testable system implies and analyze, whether a digital circuit or parts hereof are testable
• analyze smaller parts of a testable digital circuit, using well-known methods for test and design for test
• choose and optimise the test resources that are useful under certain circumstances
• given a digital circuit, describe the circuits test properties (e.g., overhead, complexity) and suggest and compare different options to improve the test properties
• investigate a technical problem [based on an introduction] and communicate the results of the examination in a clear and precise manner, using a standard format for technical reports
• assess different methods to solve a selected technical problem and evaluate their advantages and disadvantages as solutions to the problem
• constructively criticise a written report [on an academic problem], provide eventual missing parts in the report, and conclude on the entirety of the report
• discuss the methods presented [in technical papers] and relate these methods to similar findings, indicating similarities and differences

The course treats the fundamental theory for test of electronic circuits with specific emphasis on the design of highly testable digital integrated circuits.
The course covers the topics of:
– physical failure mechanisms and logic fault models,
– testability analysis (controllability and observability),
– algorithms for test pattern generation,
– fault simulation (fault coverage),
– design for test,
– boundary scan techniques,
– test planning in the design phase,
– test systems.

02203/02155/02138/02205, Basic course in digital systems or design of integrated systems

Lectures.
1 weekly problem solving session.
2-3 oral presentations (compulsory, alternating weekly between participants),
2 written assignments with oral presentation (compulsory).