Electron Microscopy and Analysis for Materials Research
Overall Course Objectives
The course aims at providing a basic theoretical understanding of the principles of electron microscopy, with special emphasis on analysis of crystalline materials. Therefore, prior basic knowledge of crystallography and crystal defects is essential in this course. The course will enable the participants to understand and interpret electron microscopy images, diffraction patterns and energy dispersive spectroscopy data obtained using scanning and transmission electron microscopes. Specimens analyzed during the course will represent metals and alloys.
The course is recommended for PhD students. Active learning will be applied in this course.
See course description in Danish
Learning Objectives
- Recognise the main components of electron microscopes
- Describe the interaction of electrons with solid matter and differentiate between elastic and inelastic interactions
- Describe the types of electron signals that result from these interactions and the principles of detection for different signals
- Interpret energy dispersive spectroscopy (EDS) data
- Interpret variations in contrast and intensity in images of the microstructure taken in the scanning electron microscope (SEM) and in the transmission electron microscope (TEM)
- Analyse electron diffraction effects and patterns in both SEM and TEM
- Evaluate the relevance of available electron microscopy techniques for a chosen project
- Formulate strategies for specimen preparation, observations and analysis for a specific project
Course Content
This course introduces electron microscopy as a method for characterizing the microstructure, crystallographic orientations and local chemistry of metals and alloys. Students will learn the operating principles of the transmission and scanning electron microscopes, and how to obtain and interpret images, diffraction patterns and energy dispersive spectroscopy data. In addition, each student will be involved in practical work using at least one of the electron microscopy techniques. This form of study will involve discussion with and guidance from a member of DTU staff.
Topics will include:
• Main components of electron microscopes
• Interaction of electrons with solid matter
• Electron detection for different signals and image formation in TEM and SEM
• Different types of TEM contrast (diffraction contrast, mass-thickness contrast, phase contrast)
• Imaging TEM techniques (bright-field, dark-field, high-resolution)
• Spectroscopic methods
• Diffraction patterns in TEM and SEM (EBSD)
• Specimen preparation for TEM and SEM
Recommended prerequisites
41658/41650/41659
Teaching Method
Lectures, group work, hands-on experience
Faculty
Limited number of seats
Minimum: 6, Maximum: 12.
Please be aware that this course has a minimum requirement for the number of participants needed, in order for it to be held. If these requirements are not met, then the course will not be held. Furthermore, there is a limited number of seats available. If there are too many applicants, a pool will be created for the remainder of the qualified applicants, and they will be selected at random. You will be informed 8 days before the start of the course, whether you have been allocated a spot.